Two-step method of the measurement data processing of the high-sensitivity radiometric system

Authors

  • S. N. Peregudov National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev, Ukraine
  • O. P. Yanenko National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev, Ukraine
  • D. O. Dolich National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev, Ukraine

DOI:

https://doi.org/10.20535/RADAP.2016.65.79-89

Keywords:

radіometеr, measurement data, measurement error

Abstract

Introduction. The radiometry systems for registration low-intensity noise signals are widely used in science and technique. Automation of such apparatus allows to improve the precision of measurements and facilitate interpretation of results. Bases of method. One of problems is influence of external radiations on the object of researches. Such radiation arises up at transformation of output signals of the radiometric system in time to the transmission of them in the device of the data processing. The decision of problem, offered in the article, consists in pre-processing of signals through in a digital integrator and post-processing in a computer. The offered method and his enginneering realization provide the automatic measuring data processing, and can be used for design of the complex systems: panoramic radiometers, multichannel correlators, and other – for the analysis of the low-intensity noise signals. Conclusions. The method allows to lower the degree of influencing of radiometer radiations on the test subject, to promote precision of measurements and lower the cost of apparatus.

Author Biographies

S. N. Peregudov, National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

Perehudov S. M.

O. P. Yanenko, National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

Yanenko О. P.

D. O. Dolich, National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

Dolich D. О.

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Published

2016-06-30

Issue

65

Section

Theory and Practice of Radio Measurements

License

Copyright (c) 2020 S. N. Peregudov, O. P. Yanenko, D. O. Dolich

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