Influence of the Matrix Structure of the Modulator and Detector on the Optical Spectrum Analyzer Output Signal

Authors

  • V. H. Kolobrodov National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute", Ukraine
  • G. S. Tymchik National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute", Ukraine
  • V. I. Mykytenko National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute", Ukraine
  • M. S. Kolobrodov National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute", Ukraine
  • M. M. Lutsiuk National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute", Ukraine

DOI:

https://doi.org/10.20535/RADAP.2018.72.78-85

Keywords:

digital optoelectronic spectrum analyzer, matrix light modulator, matrix detector, spatial spectrum of the image

Abstract

In this article, we investigate the physical and mathematical model of a coherent optical spectrum analyzer (COSA), which uses a matrix light modulator and a matrix detector as input and output devices. This model allows to define distortions in the output signal of the spectrum analyzer and the error in determining the signal spatial frequency. The study of this model showed that form of the signal at the COSA’s output depends on the pixels sizes of modulator and detector matrices, as well as on the aberrations of the Fourier lens entrance pupil diameter. The output signal is a convolution of an ideal input signal spectrum with a discrete spatial transmission spectrum of the modulator, which is followed by convolution with a discrete sensitivity of the matrix detector. This means that the spectrum of the signal under investigation is distorted by the spatial spectrum of the modulator and the matrix structure of the matrix detector. An important feature of the signal is its independence from the phase shift, which is caused by the displacement of the modulator center relative to the optical axis of the spectrum analyzer. The output signal of COSA consists of an infinite number of diffraction maximum, each of which has three maximum, the distance between which is proportional to the spatial frequency of the test signal. The position (frequency) of the maximum is determined by the pixel size, and their width by the size of the modulator. Obtain the formulas for determining the spatial frequency of the test signal, which differ substantially from the traditional formula and depend on the position of the central and lateral maximum in the diffraction maximum. The error in measuring the frequency depends on the size of the detector pixel, focal length of the Fourier lens, and the modulator matrix size. Developed the method for determining the error in measuring the spatial frequency of a harmonic signal. The error is defined as the difference between the true frequency corresponding to the position of the center of the diffraction maximum and the measured frequency corresponding to the position of the pixel center which has the maximum signal.

Author Biographies

V. H. Kolobrodov, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Kolobrodov V. G., Doctor of technical sciences, professor, head of department of the optical and opto-electronic devices

G. S. Tymchik, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Tymchik G. S.

V. I. Mykytenko, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Mykytenko V. I.

M. S. Kolobrodov, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Kolobrodov M. S.

M. M. Lutsiuk, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Lutsiuk M. M.

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Published

2018-03-30

Issue

Section

Computing methods in radio electronics